Modelling of drain current in tunnelling field-effect transistor based on strained armchair graphene nanoribbons

Open

E. Suhendi, R. Syariati, F.A. Noor, Khairurrijal

2017 IOP Conference Series: Materials Science and Engineering Vol. 180 Issue 1 Conference paper Cited by 0 SDG 7 Quartile

Abstract

A tunnelling field-effect transistor (TFET) based armchair graphenenanoribbons (AGNRs) with variation of uniaxial strain has been modeled. Bandgap of strained AGNR estimated by an extended tight binding method is applied to obtain electrical characteristics of a TFET under the quantum capacitance limit device approximation. Furthermore, the electron transmittance is calculated by utilizing the WKB (Wentzel-Kramers-Brillouin) approach. The obtained transmittance is then used to calculate the drain current by employing the Landauer formula. The results show that strain parameter has significant effect on the current. In other words, the electrical characteristics of AGNR TFET can be tuned by the strain of AGNR. © Published under licence by IOP Publishing Ltd.

Affiliations

Physics of Electronic Materials and Modelling Research Division, Faculty of Mathematics and Natural Sciences Education, Universitas Pendidikan Indonesia, Jalan Dr. Setiabudhi 229, Bandung, 40154, Indonesia; Physics of Electronic Materials Research Division, Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Jalan Ganesa 10, Bandung, 40132, Indonesia

Research at a Glance

Premium content — register to unlock

Research at a Glance

Register to unlock

Topics & SDG Alignment

Premium content — register to unlock

Topics & SDG Alignment

Register to unlock

Collaboration

Premium content — register to unlock

Collaboration

Register to unlock

Author Profile (Selected)

Premium content — register to unlock

Author Profile (Selected)

Register to unlock

References Overview

Premium content — register to unlock

References Overview

Register to unlock

Journal & Source

Premium content — register to unlock

Journal & Source

Register to unlock

Metadata & Integrity

Premium content — register to unlock

Metadata & Integrity

Register to unlock